Composition-dependent layered structure and transport properties in BiTe thin films

Y. Kim; S. Cho; A. DiVenere; G. K L Wong; J. B. Ketterson

doi:10.1103/PhysRevB.63.155306

Composition-dependent layered structure and transport properties in BiTe thin films

Y. Kim, S. Cho, A. DiVenere, G. K L Wong, J. B. Ketterson

Physics and Astronomy

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39 Scopus citations

Abstract

We have studied the compositional dependence of the layered structure of Bi1 + xTe1-X thin films and its relation with the transport properties. We have observed that the Bi_1+xTe_1-x films have a stable structure near the Bi₁Te₁ composition and that their crystallinity depends strongly upon the compositional deviation from stoichiometric Bi₁Te₁. We have determined possible layered structures, configured with two sequences of Bi–Bi and Te–Bi–Te–Bi–Te, corresponding to Bi and Te binary compositions using x-ray diffraction analysis. Their c-axis lattice constants were in the range of 36 å and 136 å. Temperature-dependent thermopowers of the films reveal that as the composition changes from Te rich to Bi rich, the polarity varies from n type to p type.

Original language	English (US)
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	63
Issue number	15
DOIs	https://doi.org/10.1103/PhysRevB.63.155306
State	Published - Mar 26 2001

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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title = "Composition-dependent layered structure and transport properties in BiTe thin films",

abstract = "We have studied the compositional dependence of the layered structure of Bi1 + xTe1-X thin films and its relation with the transport properties. We have observed that the Bi1+xTe1-x films have a stable structure near the Bi1Te1 composition and that their crystallinity depends strongly upon the compositional deviation from stoichiometric Bi1Te1. We have determined possible layered structures, configured with two sequences of Bi–Bi and Te–Bi–Te–Bi–Te, corresponding to Bi and Te binary compositions using x-ray diffraction analysis. Their c-axis lattice constants were in the range of 36 {\aa} and 136 {\aa}. Temperature-dependent thermopowers of the films reveal that as the composition changes from Te rich to Bi rich, the polarity varies from n type to p type.",

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AU - Kim, Y.

AU - Cho, S.

AU - DiVenere, A.

AU - Wong, G. K L

AU - Ketterson, J. B.

PY - 2001/3/26

Y1 - 2001/3/26

N2 - We have studied the compositional dependence of the layered structure of Bi1 + xTe1-X thin films and its relation with the transport properties. We have observed that the Bi1+xTe1-x films have a stable structure near the Bi1Te1 composition and that their crystallinity depends strongly upon the compositional deviation from stoichiometric Bi1Te1. We have determined possible layered structures, configured with two sequences of Bi–Bi and Te–Bi–Te–Bi–Te, corresponding to Bi and Te binary compositions using x-ray diffraction analysis. Their c-axis lattice constants were in the range of 36 å and 136 å. Temperature-dependent thermopowers of the films reveal that as the composition changes from Te rich to Bi rich, the polarity varies from n type to p type.

AB - We have studied the compositional dependence of the layered structure of Bi1 + xTe1-X thin films and its relation with the transport properties. We have observed that the Bi1+xTe1-x films have a stable structure near the Bi1Te1 composition and that their crystallinity depends strongly upon the compositional deviation from stoichiometric Bi1Te1. We have determined possible layered structures, configured with two sequences of Bi–Bi and Te–Bi–Te–Bi–Te, corresponding to Bi and Te binary compositions using x-ray diffraction analysis. Their c-axis lattice constants were in the range of 36 å and 136 å. Temperature-dependent thermopowers of the films reveal that as the composition changes from Te rich to Bi rich, the polarity varies from n type to p type.

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Composition-dependent layered structure and transport properties in BiTe thin films

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