Comprehensive Analysis, Modeling and Design for Hold-Timing Resiliency in Voltage Scalable Design

Huanyu Wang, Geng Xie, Jie Gu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Resiliency to timing violation is a crucial requirement for low power electronics operating across a wide range of supply voltages. Although many existing solutions enhance setup timing tolerance for the higher performance, an accurate modeling and design strategy for hold resiliency dealing with conflicting requirement from both high voltages and low voltages has not been established. This paper proposes a novel voltage-scalable modeling technique that leverages conventional static timing analysis and efficient statistical analysis to achieve accurate stochastic hold timing analysis. Several highly nonlinear behaviors of circuit operation are also incorporated into the proposed model to achieve a model accuracy of within 10% of spice Monte-Carlos simulation. Leveraging the proposed modeling technique, a novel hold resilience design technique is proposed to eliminate the excessive hold fixing operation for low voltage operation and its associated performance degradation at high voltage while still being compatible with conventional design closure flow. The proposed design methodology is demonstrated in a 45nm DSP processor design enabling a voltage-scalable operation from 0.35V to 0.9V eliminating more than 20,000 hold buffers as well as 23% performance degradation at high voltages due to hold fixing.
Original languageEnglish (US)
Title of host publicationISLPED '16 Proceedings of the 2016 International Symposium on Low Power Electronics and Design
PublisherACM
Pages22-27
Number of pages6
ISBN (Print)978-1450341851
StatePublished - 2016

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    Wang, H., Xie, G., & Gu, J. (2016). Comprehensive Analysis, Modeling and Design for Hold-Timing Resiliency in Voltage Scalable Design. In ISLPED '16 Proceedings of the 2016 International Symposium on Low Power Electronics and Design (pp. 22-27). ACM.