Abstract
We examine the structural and electronic properties of LaNiO3 and NdNiO3 epitaxial thin films grown on cubic (001) SrTiO 3 from the viewpoint of bulk crystal symmetry and misfit strain. X-ray scattering and polarization-dependent x-ray absorption spectroscopy measurements are performed to determine the crystal symmetry and extract the local Ni 3d orbital response, respectively, to understand the strain-induced distortions of the bulk structure. A strain-induced orbital polarization is found in NdNiO3 films, but is absent in LaNiO3 films. The difference in electronic structure is attributed to the bulk thermodynamic phases through group theoretical methods, which reveals that thin film perovskites retain a "memory" of their preferred electronic and structural configurations.
Original language | English (US) |
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Article number | 205112 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 88 |
Issue number | 20 |
DOIs | |
State | Published - Nov 12 2013 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics