Connecting electrical and molecular properties of semiconducting polymers for thin-film transistors

Michael L. Chabinyc; Leslie H. Jimison; Jonathan Rivnay; Alberto Salleo

doi:10.1557/mrs2008.140

Connecting electrical and molecular properties of semiconducting polymers for thin-film transistors

Michael L. Chabinyc, Leslie H. Jimison, Jonathan Rivnay, Alberto Salleo

Biomedical Engineering

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

An overview of recent work on the connection between electrical and molecular properties of semiconducting polymers for thin-film transistors (TFTs) is presented. A description of the molecular packing and microstructure of amorphous to semicrystalline semiconducting polymers is presented. The features of basic models for electrical transport in TFTs are discussed. These studies indicate that defect states and traps are as important as ordered domains for understanding transport in semiconducting polymers. Advanced methods, such as electric force microscopy, useful for measuring the characteristics of defect states and charge traps, are briefly reviewed.

Original language	English (US)
Pages (from-to)	683-689
Number of pages	7
Journal	MRS Bulletin
Volume	33
Issue number	7
DOIs	https://doi.org/10.1557/mrs2008.140
State	Published - Jul 2008

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Physical and Theoretical Chemistry

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10.1557/mrs2008.140

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title = "Connecting electrical and molecular properties of semiconducting polymers for thin-film transistors",

abstract = "An overview of recent work on the connection between electrical and molecular properties of semiconducting polymers for thin-film transistors (TFTs) is presented. A description of the molecular packing and microstructure of amorphous to semicrystalline semiconducting polymers is presented. The features of basic models for electrical transport in TFTs are discussed. These studies indicate that defect states and traps are as important as ordered domains for understanding transport in semiconducting polymers. Advanced methods, such as electric force microscopy, useful for measuring the characteristics of defect states and charge traps, are briefly reviewed.",

author = "Chabinyc, {Michael L.} and Jimison, {Leslie H.} and Jonathan Rivnay and Alberto Salleo",

note = "Funding Information: A. Salleo and L.H. Jimison gratefully acknowledge financial support from the National Science Foundation in the form of a Career Award and a Graduate Student Fellowship, respectively. J. Rivnay gratefully acknowledges the Office of Naval Research for support through an NDSEG Fellowship.",

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AU - Rivnay, Jonathan

AU - Salleo, Alberto

N1 - Funding Information: A. Salleo and L.H. Jimison gratefully acknowledge financial support from the National Science Foundation in the form of a Career Award and a Graduate Student Fellowship, respectively. J. Rivnay gratefully acknowledges the Office of Naval Research for support through an NDSEG Fellowship.

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AB - An overview of recent work on the connection between electrical and molecular properties of semiconducting polymers for thin-film transistors (TFTs) is presented. A description of the molecular packing and microstructure of amorphous to semicrystalline semiconducting polymers is presented. The features of basic models for electrical transport in TFTs are discussed. These studies indicate that defect states and traps are as important as ordered domains for understanding transport in semiconducting polymers. Advanced methods, such as electric force microscopy, useful for measuring the characteristics of defect states and charge traps, are briefly reviewed.

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Connecting electrical and molecular properties of semiconducting polymers for thin-film transistors

Abstract

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