INIS
films
100%
substrates
100%
layers
100%
buffers
100%
interfaces
66%
defects
66%
dislocations
66%
transmission electron microscopy
33%
resolution
33%
crystallography
33%
interactions
33%
charges
33%
density
33%
vectors
33%
shear
33%
microstructure
33%
crystal defects
33%
stacking faults
33%
Physics
Antiphase Boundaries
100%
Substrates
100%
Transmission Electron Microscopy
33%
High Resolution
33%
Crystal Defect
33%
Lattice Mismatch
33%
Model
33%
Plane
33%
Shears
33%
Boundaries
33%
Material Science
Buffer Layer
100%
Stacking Fault
33%
Lattice Mismatch
33%
Film
33%
Density
33%
Dislocation (Crystal)
33%
Microstructure
33%
Biochemistry, Genetics and Molecular Biology
Dislocation
100%
Stacking Fault
50%
Density
50%
High-Resolution Transmission Electron Microscopy
50%