Contactless excitation of acoustic resonance in insulating wafers

Gan Zhai, Yizhou Xin, Cameron J. Kopas, Ella Lachman, Mark Field, Josh Y. Mutus, Katarina Cicak, José Aumentado, Zuhawn Sung, W. P. Halperin*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Contactless excitation and detection of high harmonic acoustic overtones in a thin insulator single crystal are described using radio frequency spectroscopy techniques. Single crystal [001] silicon wafer samples were investigated, one side covered with a Nb thin film, the common starting point for the fabrication of quantum devices. The coupling between electromagnetic signals and mechanical oscillation is achieved from the Lorentz force generated by an external magnetic field. This method is suitable for any sample with a metallic surface or covered with a thin metal film. High resolution measurements of the temperature dependence of the sound velocity and elastic constants of silicon are reported and compared with known results.

Original languageEnglish (US)
Article number142201
JournalApplied Physics Letters
Volume121
Issue number14
DOIs
StatePublished - Oct 3 2022

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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