Correlation of polysiloxane molecular structure to shear-thinning power-law exponent using elastohydrodynamic film thickness measurements

Thomas J. Zolper*, Paul Shiller, Manfred Jungk, Tobin J. Marks, Yip Wah Chung, Aaron Greco, Gary Doll, Babak Lotfizadeh Dehkordi, Qian Wang

*Corresponding author for this work

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Material Science

Engineering

Chemical Engineering