Abstract
In order to increase the storage density of hard disk drives, a detailed understanding of the magnetic structure of the granular magnetic layer is essential. Here, we demonstrate an experimental procedure of imaging recorded bits on heat-assisted magnetic recording (HAMR) media in cross section using Lorentz transmission electron microscopy (TEM). With magnetic force microscopy and focused ion beam (FIB), we successfully targeted a single track to prepare cross-sectional TEM specimens. Then, we characterized the magnetic structure of bits with their precise location and orientation using Fresnel mode of Lorentz TEM. This method can promote understanding of the correlation between bits and their material structure in HAMR media to design better the magnetic layer.
Original language | English (US) |
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Article number | A2056 |
Journal | IEEE Transactions on Magnetics |
Volume | 54 |
Issue number | 1 |
DOIs | |
State | Published - Jan 2018 |
Keywords
- Cross-sectional magnetic imaging
- Fresnel imaging mode
- Heat-assisted magnetic recording (HAMR) media
- Lorentz transmission electron microscopy (TEM)
- Recorded bits
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering