Corrigendum to: “Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials” [Ultramicroscopy 184 (2018) 293–309](S030439911730339X)(10.1016/j.ultramic.2017.10.003)

Ming Du; Chris Jacobsen

doi:10.1016/j.ultramic.2020.113013

Corrigendum to: “Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials” [Ultramicroscopy 184 (2018) 293–309](S030439911730339X)(10.1016/j.ultramic.2017.10.003)

Ming Du, Chris Jacobsen^*

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Comment/debate › peer-review

2 Scopus citations

Abstract

During follow-on calculations, we found a few minor errors in our previous publication [Ultramicroscopy184, 293–309 (2018); doi:10.1016/j.ultramic.2017.10.003]. We present here the necessary corrections. The full revised manuscript, with the corrected parts indicated in blue color text, is available at https://arxiv.org/abs/2004.10069.

Original language	English (US)
Article number	113013
Journal	Ultramicroscopy
Volume	216
DOIs	https://doi.org/10.1016/j.ultramic.2020.113013
State	Published - Sep 2020

Funding

Keywords

Electron
Radiation damage
Thick specimen
X-Ray

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Instrumentation
Atomic and Molecular Physics, and Optics

Access to Document

10.1016/j.ultramic.2020.113013

Fingerprint

Dive into the research topics of 'Corrigendum to: “Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials” [Ultramicroscopy 184 (2018) 293–309](S030439911730339X)(10.1016/j.ultramic.2017.10.003)'. Together they form a unique fingerprint.

Cite this

@article{235d638e99c348ec89be5d8d90df7711,

title = "Corrigendum to: “Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials” [Ultramicroscopy 184 (2018) 293–309](S030439911730339X)(10.1016/j.ultramic.2017.10.003)",

abstract = "During follow-on calculations, we found a few minor errors in our previous publication [Ultramicroscopy184, 293–309 (2018); doi:10.1016/j.ultramic.2017.10.003]. We present here the necessary corrections. The full revised manuscript, with the corrected parts indicated in blue color text, is available at https://arxiv.org/abs/2004.10069.",

keywords = "Electron, Radiation damage, Thick specimen, X-Ray",

author = "Ming Du and Chris Jacobsen",

note = "Publisher Copyright: {\textcopyright} 2020 Elsevier B.V.",

year = "2020",

month = sep,

doi = "10.1016/j.ultramic.2020.113013",

language = "English (US)",

volume = "216",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

}

Corrigendum to: “Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials” [Ultramicroscopy 184 (2018) 293–309](S030439911730339X)(10.1016/j.ultramic.2017.10.003). / Du, Ming; Jacobsen, Chris.
In: Ultramicroscopy, Vol. 216, 113013, 09.2020.

Research output: Contribution to journal › Comment/debate › peer-review

TY - JOUR

T1 - Corrigendum to

T2 - “Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials” [Ultramicroscopy 184 (2018) 293–309](S030439911730339X)(10.1016/j.ultramic.2017.10.003)

AU - Du, Ming

AU - Jacobsen, Chris

PY - 2020/9

Y1 - 2020/9

N2 - During follow-on calculations, we found a few minor errors in our previous publication [Ultramicroscopy184, 293–309 (2018); doi:10.1016/j.ultramic.2017.10.003]. We present here the necessary corrections. The full revised manuscript, with the corrected parts indicated in blue color text, is available at https://arxiv.org/abs/2004.10069.

AB - During follow-on calculations, we found a few minor errors in our previous publication [Ultramicroscopy184, 293–309 (2018); doi:10.1016/j.ultramic.2017.10.003]. We present here the necessary corrections. The full revised manuscript, with the corrected parts indicated in blue color text, is available at https://arxiv.org/abs/2004.10069.

KW - Electron

KW - Radiation damage

KW - Thick specimen

KW - X-Ray

UR - http://www.scopus.com/inward/record.url?scp=85088020547&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85088020547&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2020.113013

DO - 10.1016/j.ultramic.2020.113013

M3 - Comment/debate

C2 - 32554165

AN - SCOPUS:85088020547

SN - 0304-3991

VL - 216

JO - Ultramicroscopy

JF - Ultramicroscopy

M1 - 113013

ER -

Corrigendum to: “Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials” [Ultramicroscopy 184 (2018) 293–309](S030439911730339X)(10.1016/j.ultramic.2017.10.003)

Abstract

Funding

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this