Corrigendum to: “Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials” [Ultramicroscopy 184 (2018) 293–309](S030439911730339X)(10.1016/j.ultramic.2017.10.003)

Ming Du, Chris Jacobsen*

*Corresponding author for this work

Research output: Contribution to journalComment/debatepeer-review

1 Scopus citations

Abstract

During follow-on calculations, we found a few minor errors in our previous publication [Ultramicroscopy184, 293–309 (2018); doi:10.1016/j.ultramic.2017.10.003]. We present here the necessary corrections. The full revised manuscript, with the corrected parts indicated in blue color text, is available at https://arxiv.org/abs/2004.10069.

Original languageEnglish (US)
Article number113013
JournalUltramicroscopy
Volume216
DOIs
StatePublished - Sep 2020

Keywords

  • Electron
  • Radiation damage
  • Thick specimen
  • X-Ray

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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