Abstract
Co/Pd layered films with Si added to the Co layers have been found to show a high perpendicular anisotropy with K2.1×105 J m-3, good coercivity, high coercivity ratio, and high remanence ratio. Samples with thin (Co+Si) layers contain uniform, narrow stripe domains. The microstructure consists of a large-scale polycrystalline structure, a fine-scale structure that may be amorphous, and a banded structure in which CoSi-rich and CoSi2-rich regions are separated, in addition to regions of Co-Pd alloy and Pd. Clear interfaces between the (Co+Si) and the Pd layers were not found.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 3552-3555 |
| Number of pages | 4 |
| Journal | Physical Review B |
| Volume | 48 |
| Issue number | 5 |
| DOIs | |
| State | Published - Jan 1 1993 |
ASJC Scopus subject areas
- Condensed Matter Physics
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Kim, Y. H., Petford-Long, A. K., & Jakubovics, J. P. (1993). (Co+Si)/Pd films with a high perpendicular magnetic anisotropy. Physical Review B, 48(5), 3552-3555. https://doi.org/10.1103/PhysRevB.48.3552