TY - JOUR
T1 - (Co+Si)/Pd films with a high perpendicular magnetic anisotropy
AU - Kim, Y. H.
AU - Petford-Long, A. K.
AU - Jakubovics, J. P.
PY - 1993/1/1
Y1 - 1993/1/1
N2 - Co/Pd layered films with Si added to the Co layers have been found to show a high perpendicular anisotropy with K2.1×105 J m-3, good coercivity, high coercivity ratio, and high remanence ratio. Samples with thin (Co+Si) layers contain uniform, narrow stripe domains. The microstructure consists of a large-scale polycrystalline structure, a fine-scale structure that may be amorphous, and a banded structure in which CoSi-rich and CoSi2-rich regions are separated, in addition to regions of Co-Pd alloy and Pd. Clear interfaces between the (Co+Si) and the Pd layers were not found.
AB - Co/Pd layered films with Si added to the Co layers have been found to show a high perpendicular anisotropy with K2.1×105 J m-3, good coercivity, high coercivity ratio, and high remanence ratio. Samples with thin (Co+Si) layers contain uniform, narrow stripe domains. The microstructure consists of a large-scale polycrystalline structure, a fine-scale structure that may be amorphous, and a banded structure in which CoSi-rich and CoSi2-rich regions are separated, in addition to regions of Co-Pd alloy and Pd. Clear interfaces between the (Co+Si) and the Pd layers were not found.
UR - http://www.scopus.com/inward/record.url?scp=35949007417&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=35949007417&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.48.3552
DO - 10.1103/PhysRevB.48.3552
M3 - Article
AN - SCOPUS:35949007417
VL - 48
SP - 3552
EP - 3555
JO - Physical Review B-Condensed Matter
JF - Physical Review B-Condensed Matter
SN - 0163-1829
IS - 5
ER -