Critical length scales for the deformation of amorphous metals containing nanocrystals

A. C. Lund, C. A. Schuh*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

25 Scopus citations


Shear localization is studied in simulated amorphous systems containing individual nanocrystalline inclusions. Systematic variation of the inclusion diameter and the shear band thickness reveals a crossover in length scales that separates distinct plastic flow mechanisms in and around the nanocrystalline inclusion. When considered relative to the shear band thickness, small inclusions deform via heterogeneous, interface-dominated mechanisms, while large inclusions yield via the homogeneous nucleation of dislocations in the nanocrystal interior; nanocrystals roughly twice as large as the shear band width are required for the strongest interaction.

Original languageEnglish (US)
Pages (from-to)603-611
Number of pages9
JournalPhilosophical Magazine Letters
Issue number8
StatePublished - Aug 2007

ASJC Scopus subject areas

  • Condensed Matter Physics


Dive into the research topics of 'Critical length scales for the deformation of amorphous metals containing nanocrystals'. Together they form a unique fingerprint.

Cite this