Abstract
This paper describes a method of intensity measurement of diffraction spots from digitized negatives using cross-correlation. The method is highly robust against noise and diffuse background in the diffraction pattern; therefore intensities of very weak spots such as those due to a reconstructed surface can be measured accurately. The reliability of this method and the implication for a quantitative structure analysis by transmission electron diffraction are discussed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 15-18 |
| Number of pages | 4 |
| Journal | Ultramicroscopy |
| Volume | 53 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 1994 |
Funding
This work is supported by the Air Force Office on Scientific Research on grant number AFOSR-90-0045.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation