This paper describes a method of intensity measurement of diffraction spots from digitized negatives using cross-correlation. The method is highly robust against noise and diffuse background in the diffraction pattern; therefore intensities of very weak spots such as those due to a reconstructed surface can be measured accurately. The reliability of this method and the implication for a quantitative structure analysis by transmission electron diffraction are discussed.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics