Cross-correlation method for intensity measurement of transmission electron diffraction patterns

P. Xu*, G. Jayaram, Laurence Marks

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

38 Scopus citations

Abstract

This paper describes a method of intensity measurement of diffraction spots from digitized negatives using cross-correlation. The method is highly robust against noise and diffuse background in the diffraction pattern; therefore intensities of very weak spots such as those due to a reconstructed surface can be measured accurately. The reliability of this method and the implication for a quantitative structure analysis by transmission electron diffraction are discussed.

Original languageEnglish (US)
Pages (from-to)15-18
Number of pages4
JournalUltramicroscopy
Volume53
Issue number1
DOIs
StatePublished - Jan 1 1994

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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