Cross-Plane Thermal Conductivity Measurements in Self-Assembled Nanodielectric Heterostructures

Oluwaseyi Balogun, Baojie Lu, Binghao Wang, Antonio Facchetti, Tobin Jay Marks

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The following topics are dealt with: nanofabrication; nanowires; elemental semiconductors; nanoparticles; silicon; nanostructured materials; semiconductor growth; graphene; nanosensors; wide band gap semiconductors.
Original languageEnglish (US)
Title of host publication2018 IEEE 18th International Conference on Nanotechnology (IEEE-NANO)
PublisherIEEE
ISBN (Print)9781538653364
DOIs
StatePublished - 2019

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    Balogun, O., Lu, B., Wang, B., Facchetti, A., & Marks, T. J. (2019). Cross-Plane Thermal Conductivity Measurements in Self-Assembled Nanodielectric Heterostructures. In 2018 IEEE 18th International Conference on Nanotechnology (IEEE-NANO) IEEE. https://doi.org/10.1109/NANO.2018.8626384