Crystalline structure and magnetic and magneto-optical properties of MnSbBi thin films

K. Kang, V. G. Kravets, Amanda K. Petford-Long*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations


Mn-Sb-Bi thin films were prepared by successive r.f. or d.c. sputter deposition of elements in a trilayer configuration with either Bi or Sb as the first layer. In-situ transmission electron microscopy (TEM) observations were conducted to investigate the morphology and structure of the films, both as-deposited and after annealing at 623 K for 5 h in a high vacuum furnace. The morphology and structure of all the films are highly dependent on the first-deposited layer. For the annealed film in the configuration of Mn/Bi/Sb// a well-defined hexagonal Mn-Sb-Bi NiAs type structure with the c-axis perpendicular to the film surface was observed. The grain size (100 nm) was two times larger than that of the film having Bi as the first layer. In both kinds of film the easy direction of magnetisation was very close to the film plane. The polar Kerr rotation from the two film structures was approximately 1.0°.

Original languageEnglish (US)
Article number15646
Pages (from-to)28-37
Number of pages10
JournalThin Solid Films
Issue number1-2
StatePublished - 2002


  • Crystal structure
  • Diffusion
  • Magnetic properties and measurements
  • MnSbBi

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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