TY - GEN
T1 - Data association with ambiguous measurements
AU - Travers, Matthew
AU - Murphey, Todd
AU - Pao, Lucy
PY - 2008
Y1 - 2008
N2 - We address the problem of tracking a single object in the neighborhood of several other closely spaced, similar objects where the sensor used to do the tracking may randomly measure the wrong object. Unlike many tracking scenarios, there is no other environmental clutter producing additional erroneous measurements. The objects move together, and the sensor provides one measurement at every time step, either due to the object of interest or due to one of the other similar nearby objects. This situation of having a "mixed" set of measurements of unknown origin occurs in real world systems. While we consider the mixed-measurement problem in an example scenario, the algorithms developed can be applied to any number of associated systems with little alteration.
AB - We address the problem of tracking a single object in the neighborhood of several other closely spaced, similar objects where the sensor used to do the tracking may randomly measure the wrong object. Unlike many tracking scenarios, there is no other environmental clutter producing additional erroneous measurements. The objects move together, and the sensor provides one measurement at every time step, either due to the object of interest or due to one of the other similar nearby objects. This situation of having a "mixed" set of measurements of unknown origin occurs in real world systems. While we consider the mixed-measurement problem in an example scenario, the algorithms developed can be applied to any number of associated systems with little alteration.
UR - http://www.scopus.com/inward/record.url?scp=52449090038&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=52449090038&partnerID=8YFLogxK
U2 - 10.1109/ACC.2008.4586765
DO - 10.1109/ACC.2008.4586765
M3 - Conference contribution
AN - SCOPUS:52449090038
SN - 9781424420797
T3 - Proceedings of the American Control Conference
SP - 1875
EP - 1880
BT - 2008 American Control Conference, ACC
T2 - 2008 American Control Conference, ACC
Y2 - 11 June 2008 through 13 June 2008
ER -