Data preparation and evaluation techniques for X-ray Diffraction Microscopy

Jan Steinbrener*, Johanna Nelson, Xiaojing Huang, Stefano Marchesini, David Shapiro, Joshua J. Turner, Chris Jacobsen

*Corresponding author for this work

Research output: Contribution to journalArticle

20 Scopus citations

Abstract

The post-experiment processing of X-ray Diffraction Microscopy data is often time-consuming and difficult. This is mostly due to the fact that even if a preliminary result has been reconstructed, there is no definitive answer as to whether or not a better result with more consistently retrieved phases can still be obtained. We show here that the first step in data analysis, the assembly of two-dimensional diffraction patterns from a large set of raw diffraction data, is crucial to obtaining reconstructions of highest possible consistency. We have developed software that automates this process and results in consistently accurate diffraction patterns. We have furthermore derived some criteria of validity for a tool commonly used to assess the consistency of reconstructions, the phase retrieval transfer function, and suggest a modified version that has improved utility for judging reconstruction quality.

Original languageEnglish (US)
Pages (from-to)18598-18614
Number of pages17
JournalOptics Express
Volume18
Issue number18
DOIs
StatePublished - Aug 30 2010

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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    Steinbrener, J., Nelson, J., Huang, X., Marchesini, S., Shapiro, D., Turner, J. J., & Jacobsen, C. (2010). Data preparation and evaluation techniques for X-ray Diffraction Microscopy. Optics Express, 18(18), 18598-18614. https://doi.org/10.1364/OE.18.018598