Deep multi-stage model for automated landmarking of craniomaxillofacial CT scans

S. Palazzo*, G. Bellitto, L. Prezzavento, F. Rundo, U. Bagci, D. Giordano, R. Leonardi, C. Spampinato

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper we define a deep multi-stage architecture for automated landmarking of craniomaxillofacial (CMF) CT images. Our model is composed of three subnetworks that first localize, on reduced-resolution images, areas where landmarks may be found and then refine the search, at full-resolution scale, through a hierarchical structure aiming at increasing the granularity of the investigated region. The multi-stage pipeline is designed to deal with full resolution data and does not require any additional pre-processing step to reduce search space, as opposed to existing methods that can be only adopted for searching landmarks located in well-defined anatomical structures (e.g., mandibles). The automated landmarking system is tested on identifying landmarks located in several CMF regions, achieving an average error of 0.8 mm, significantly lower than expert readings. The proposed model also outperforms baselines and is on par with existing models that employ additional upstream segmentation, on state-of-the-art benchmarks.

Original languageEnglish (US)
Title of host publicationProceedings of ICPR 2020 - 25th International Conference on Pattern Recognition
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages9982-9987
Number of pages6
ISBN (Electronic)9781728188089
DOIs
StatePublished - 2020
Externally publishedYes
Event25th International Conference on Pattern Recognition, ICPR 2020 - Virtual, Milan, Italy
Duration: Jan 10 2021Jan 15 2021

Publication series

NameProceedings - International Conference on Pattern Recognition
ISSN (Print)1051-4651

Conference

Conference25th International Conference on Pattern Recognition, ICPR 2020
Country/TerritoryItaly
CityVirtual, Milan
Period1/10/211/15/21

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

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