Demonstration of a thick holographic Stokesmeter

Selim M Shahriar, Jong Kwon Lee, J. T. Shen, Alexander Heifetz, Renu Tripathi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Using two sets of multiplexed thick-holographic gratings, we measured the Stokes parameters for three different polarization states of an input beam. These values compared well to values measured using the conventional quarter-wave plate/linear polarizer method.

Original languageEnglish (US)
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2005
PublisherOptical Society of America
ISBN (Print)1557527709, 9781557527707
StatePublished - Jan 1 2005
EventConference on Lasers and Electro-Optics, CLEO 2005 - Baltimore, MD, United States
Duration: May 22 2005May 22 2005

Other

OtherConference on Lasers and Electro-Optics, CLEO 2005
CountryUnited States
CityBaltimore, MD
Period5/22/055/22/05

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'Demonstration of a thick holographic Stokesmeter'. Together they form a unique fingerprint.

Cite this