Depth-selective x-ray standing-wave analysis

M. J. Bedzyk*, G. Materlik, M. V. Kovalchuk

*Corresponding author for this work

Research output: Contribution to journalArticle

21 Scopus citations

Abstract

Energy-dispersive electron emission yields from silicon crystals were measured while Bragg reflecting 15-keV x rays from the (111) diffraction planes. By combining the characteristics of the excited x-ray standing-wave field with the electron-energy-loss process, it was possible to probe the structure for lattice perfection as a function of depth and to determine an energy-loss-dependent electron escape length.

Original languageEnglish (US)
Pages (from-to)4881-4884
Number of pages4
JournalPhysical Review B
Volume30
Issue number8
DOIs
StatePublished - 1984

ASJC Scopus subject areas

  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Depth-selective x-ray standing-wave analysis'. Together they form a unique fingerprint.

Cite this