Depth-selective x-ray standing-wave analysis

M. J. Bedzyk*, G. Materlik, M. V. Kovalchuk

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

23 Scopus citations


Energy-dispersive electron emission yields from silicon crystals were measured while Bragg reflecting 15-keV x rays from the (111) diffraction planes. By combining the characteristics of the excited x-ray standing-wave field with the electron-energy-loss process, it was possible to probe the structure for lattice perfection as a function of depth and to determine an energy-loss-dependent electron escape length.

Original languageEnglish (US)
Pages (from-to)4881-4884
Number of pages4
JournalPhysical Review B
Issue number8
StatePublished - 1984

ASJC Scopus subject areas

  • Condensed Matter Physics


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