Abstract
Energy-dispersive electron emission yields from silicon crystals were measured while Bragg reflecting 15-keV x rays from the (111) diffraction planes. By combining the characteristics of the excited x-ray standing-wave field with the electron-energy-loss process, it was possible to probe the structure for lattice perfection as a function of depth and to determine an energy-loss-dependent electron escape length.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 4881-4884 |
| Number of pages | 4 |
| Journal | Physical Review B |
| Volume | 30 |
| Issue number | 8 |
| DOIs | |
| State | Published - 1984 |
ASJC Scopus subject areas
- Condensed Matter Physics