TY - JOUR
T1 - Description of the Adsorption and Exciton Delocalizing Properties of p-Substituted Thiophenols on CdSe Quantum Dots
AU - Aruda, Kenneth O.
AU - Amin, Victor A.
AU - Thompson, Christopher M.
AU - Lau, Bryan
AU - Nepomnyashchii, Alexander B.
AU - Weiss, Emily A.
N1 - Funding Information:
This material is based upon work supported by the National Science Foundation under Grant CHE-1400596 and through a Graduate Research Fellowship (Grant DGE-1324585) to V.A.A. The portion of this research involving the pseudopotential calculations was also supported as part of the Center for Bio-Inspired Energy Science, an Energy Frontier Research Center funded by the U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences (BES), under Award No. DE-SC0000989. The Raman spectroscopy was funded by the Materials Research Science and Engineering Center (NUMRSEC; Grant NSF DMR-1121262) and performed in the Keck-II facility of NUANCE Center at Northwestern University. The NUANCE Center is supported by NSEC (Grant NSF EEC-0647560), MRSEC (GRant NSF DMR-1121262), the Keck Foundation, the State of Illinois, and Northwestern University.
Publisher Copyright:
© 2016 American Chemical Society.
PY - 2016/4/12
Y1 - 2016/4/12
N2 - This work describes the quantitative characterization of the interfacial chemical and electronic structure of CdSe quantum dots (QDs) coated in one of five p-substituted thiophenolates (X-TP, X = NH2, CH3O, CH3, Cl, or NO2), and the dependence of this structure on the p-substituent X. 1H NMR spectra of mixtures of CdSe QDs and X-TPs yield the number of X-TPs bound to the surface of each QD. The binding data, in combination with the shift in the energy of the first excitonic peak of the QDs as a function of the surface coverage of X-TP and Raman and NMR analysis of the mixtures, indicate that X-TP binds to CdSe QDs in at least three modes, two modes that are responsible for exciton delocalization and a third mode that does not affect the excitonic energy. The first two modes involve displacement of OPA from the QD core, whereas the third mode forms cadmium-thiophenolate complexes that are not electronically coupled to the QD core. Fits to the data using the dual-mode binding model also yield the values of Δr1, the average radius of exciton delocalization due to binding of the X-TP in modes 1 and 2. A 3D parametrized particle-in-a-sphere model enables the conversion of the measured value of Δr1 for each X-TP to the height of the potential barrier that the ligand presents for tunneling of excitonic hole into the interfacial region. The height of this barrier increases from 0.3 to 0.9 eV as the substituent, X, becomes more electron-withdrawing.
AB - This work describes the quantitative characterization of the interfacial chemical and electronic structure of CdSe quantum dots (QDs) coated in one of five p-substituted thiophenolates (X-TP, X = NH2, CH3O, CH3, Cl, or NO2), and the dependence of this structure on the p-substituent X. 1H NMR spectra of mixtures of CdSe QDs and X-TPs yield the number of X-TPs bound to the surface of each QD. The binding data, in combination with the shift in the energy of the first excitonic peak of the QDs as a function of the surface coverage of X-TP and Raman and NMR analysis of the mixtures, indicate that X-TP binds to CdSe QDs in at least three modes, two modes that are responsible for exciton delocalization and a third mode that does not affect the excitonic energy. The first two modes involve displacement of OPA from the QD core, whereas the third mode forms cadmium-thiophenolate complexes that are not electronically coupled to the QD core. Fits to the data using the dual-mode binding model also yield the values of Δr1, the average radius of exciton delocalization due to binding of the X-TP in modes 1 and 2. A 3D parametrized particle-in-a-sphere model enables the conversion of the measured value of Δr1 for each X-TP to the height of the potential barrier that the ligand presents for tunneling of excitonic hole into the interfacial region. The height of this barrier increases from 0.3 to 0.9 eV as the substituent, X, becomes more electron-withdrawing.
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U2 - 10.1021/acs.langmuir.6b00689
DO - 10.1021/acs.langmuir.6b00689
M3 - Article
C2 - 27002248
AN - SCOPUS:84964497479
SN - 0743-7463
VL - 32
SP - 3354
EP - 3364
JO - Langmuir
JF - Langmuir
IS - 14
ER -