Abstract
Modern microprocessors suffer from significant on-chip variation at the advanced technology nodes. The development of CMOS-compatible memristive devices has brought nonvolatile capability into silicon technology. This paper explores new applications for memristive devices to resolve performance degradations that result from process variation. Novel self-healing flip-flop and clock buffers are developed to automatically detect timing violation and to perform timing recovery by tuning the resistance values of memristor devices. To incorporate the circuit techniques into VLSI circuits design, novel device placement and tuning algorithms have been developed. The proposed design methodology is demonstrated in a 45-nm fast Fourier transform processor design.
Original language | English (US) |
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Article number | 8368092 |
Pages (from-to) | 2648-2660 |
Number of pages | 13 |
Journal | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Volume | 26 |
Issue number | 12 |
DOIs | |
State | Published - Dec 2018 |
Funding
Manuscript received September 2, 2017; revised January 12, 2018 and March 10, 2018; accepted April 25, 2018. Date of publication May 28, 2018; date of current version November 30, 2018. This work was supported in part by NSF under Grant CNS-1441695 and Grant CCF-1533656 and in part by SRC under Grant 2014-TS-2559. (Corresponding author: Shuyu Kong.) The authors are with the Department of Electrical Engineering and Computer Science, Northwestern University, Evanston, IL 60208 USA (e-mail: [email protected]).
Keywords
- Memristor
- process variation
- self-healing
- sequential circuits
- timing resilient
ASJC Scopus subject areas
- Software
- Hardware and Architecture
- Electrical and Electronic Engineering