Detecting nanoscale refractive index fluctuations using partial wave spectroscopic microscopy

Hariharan Subramanian, Prabhakar Pradhan, Dhwanil Damania, Daniel Balikov, Sameer Maheshwari, Vadim Backman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Partial-wave spectroscopic microscopy (PWS) provides unprecedented insights into the nanocale refractive index fluctuations within biological cells. We demonstrate the nanoscale sensitivity of PWS using experiments with nanostructure models and human colon adenocarcinoma (HT29) cell lines.

Original languageEnglish (US)
Title of host publicationNovel Techniques in Microscopy, NTM 2009
PublisherOptical Society of America (OSA)
ISBN (Print)9781557528711
DOIs
StatePublished - 2009
EventNovel Techniques in Microscopy, NTM 2009 - Vancouver, Canada
Duration: Apr 26 2009Apr 30 2009

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherNovel Techniques in Microscopy, NTM 2009
CountryCanada
CityVancouver
Period4/26/094/30/09

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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