Determination of the isothermal nucleation and growth parameters for the crystallization of thin Ge 2Sb 2Te 5 films

G. Ruitenberg*, A. K. Petford-Long, R. C. Doole

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

145 Scopus citations

Abstract

The isothermal crystallization of thin amorphous Ge 2Sb 2Te 5 films, sandwiched between Si 3N 4 dielectric layers, was followed in real time using in situ transmission electron microscopy. A temperature-dependent incubation time is observed. After this incubation time, the crystallization is found to follow Johnson-Mehl-Avrami-Kolmogorov (JMAK) transformation kinetics. The JMAK parameters were determined, as well as the individual nucleation and growth parameters. The relationships between the JMAK parameters and the nucleation and growth parameters were tested and found to be valid. Nucleation was found to occur at the interfaces with the dielectric layers. The average grain size after crystallization did not show appreciable temperature dependence in the temperature range investigated.

Original languageEnglish (US)
Pages (from-to)3116-3123
Number of pages8
JournalJournal of Applied Physics
Volume92
Issue number6
DOIs
StatePublished - Sep 15 2002

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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