Determination of the position and vibrational amplitude of an adsorbate by means of multiple-order x-ray standing-wave measurements

M. J. Bedzyk*, G. Materlik

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

65 Scopus citations

Abstract

For a submonolayer of Br atoms adsorbed onto a real Ge(111) surface, x-ray interference fields were used to determine the Br position with respect to the substrate (111) and (333) diffraction planes. The results from both the (111) and (333) measurements are consistent with the onefold-atop-site surface model. The increase in local sensitivity from using the (333) diffraction planes also enabled us to demonstrate the use of x-ray interference fields for determining the vibrational amplitude of an adsorbate.

Original languageEnglish (US)
Pages (from-to)4110-4112
Number of pages3
JournalPhysical Review B
Volume31
Issue number6
DOIs
StatePublished - 1985

ASJC Scopus subject areas

  • Condensed Matter Physics

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