Determination of yielding and debonding in Al-Cu thin films from residual stress measurements via diffraction

C. J. Shute, J. B. Cohen

Research output: Contribution to journalArticlepeer-review

37 Scopus citations

Fingerprint Dive into the research topics of 'Determination of yielding and debonding in Al-Cu thin films from residual stress measurements via diffraction'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy