Diagnostics and growth of organic thin films for electro-optic modulators with low driving voltage

Zhifu Liu*, Sergey S. Sarkisov, Michael J. Curley, Alexander Leyderman, Yulong Cui, Javier Wu Li, Benjamin Penn

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

The focus of this paper is the characterization of electro-optic properties of single crystal thin films of organic material NPP grown by the plate-guided method. Characterization was performed using the longitudinal a.c. modulation technique. Half-wave voltage Vπ, figure-of-merit F, and electro-optic coefficient r63 were estimated to be 3.24 kV, 0.98×10-10 m/V and 25.8×10-12 m/V respectively. We found that crystalline z-axis is off the normal to the plane of the film at an angle of 70. We also proposed a transverse version of a thin film electro-optic modulator with low driving voltage, which is based on a single-arm thin film waveguide interferometer.

Original languageEnglish (US)
Pages (from-to)40-51
Number of pages12
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4098
StatePublished - Jan 1 2000
EventOptical Devices and Diagnostics in Materials Science - San Diego, USA
Duration: Aug 1 2000Aug 4 2000

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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