@inproceedings{ffe2945b33d849dba508831a7b1d15ed,
title = "Dictionary-based sparse representation for resolution improvement in laser voltage imaging of CMOS integrated circuits",
abstract = "The rapid decrease in the dimensions of integrated circuits with a simultaneous increase in component density have introduced resolution challenges for optical failure analysis techniques. Although optical microscopy efforts continue to increase resolution of optical systems through hardware modifications, signal processing methods are essential to complement these efforts to meet the resolution requirements for the nanoscale integrated circuit technologies. In this work, we focus on laser voltage imaging as the optical failure analysis technique and show how an overcomplete dictionary-based sparse representation can improve resolution and localization accuracy. We describe a reconstruction approach based on this sparse representation and validate its performance on simulated data. We achieve an 80% reduction of the localization error.",
author = "{Berkin Cilingiroglu}, T. and Mahmoud Zangeneh and Aydan Uyar and Karl, {W. Clem} and Janusz Konrad and Ajay Joshi and Goldberg, {Bennett B.} and Unlu, {M. Selim}",
year = "2015",
month = apr,
day = "22",
language = "English (US)",
series = "Proceedings -Design, Automation and Test in Europe, DATE",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "597--600",
booktitle = "Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015",
address = "United States",
note = "2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 ; Conference date: 09-03-2015 Through 13-03-2015",
}