Dictionary-based sparse representation for resolution improvement in laser voltage imaging of CMOS integrated circuits

Keyphrases

• CMOS Integrated Circuits 100%
• Dictionary-based 100%
• Failure Analysis 66%
• Integrated Circuit Technology 33%
• Integrated Circuits 33%
• Laser Voltage Imaging 100%
• Localization Accuracy 33%
• Localization Error 33%
• Optical Microscopy 33%
• Optical System 33%
• Overcomplete Dictionary 33%
• Reconstruction Approach 33%
• Resolution Improvement 100%
• Resolution Requirements 33%
• Signal Processing Techniques 33%
• Sparse Representation 100%

Engineering

• CMOS Integrated Circuits 100%
• Failure Analysis 100%
• Integrated Circuit 100%
• Localization Accuracy 50%
• Localization Error 50%
• Nanoscale 50%
• Optical Systems 50%
• Processing Method 50%
• Simulated Data 50%