Dielectric Breakdown of 2D Hybrid Organic-Inorganic Perovskites

Mengru Jin; Eugenia S. Vasileiadou; Ioannis Spanopoulos; Arushi Chaudhry; Mercouri G. Kanatzidis; Qing Tu

doi:10.1021/acsenergylett.4c03269

Dielectric Breakdown of 2D Hybrid Organic-Inorganic Perovskites

Mengru Jin, Eugenia S. Vasileiadou, Ioannis Spanopoulos, Arushi Chaudhry, Mercouri G. Kanatzidis, Qing Tu^*

^*Corresponding author for this work

Chemistry

Research output: Contribution to journal › Article › peer-review

Abstract

Our knowledge about dielectric breakdown of 2D hybrid organic-inorganic perovskites (HOIPs) is limited, although the breakdown is widely observed and harnessed for new device applications. Here, we investigate the out-of-plane breakdown of a benchmark 2D HOIP family, (BA)₂MA_n-1Pb_nI_3n+1 (BA = butylammonium, MA = methylammonium, and n = 1-5), by conductive atomic force microscopy. Unlike conventional 2D materials, 2D HOIPs manifest milder breakdown morphologies, no clear trend of layer-by-layer damages, and stochastic characteristics of defect percolation, likely due to their low in-plane vs out-of-plane anisotropy. The influence of thickness, ramping rate, and n on the breakdown strength (E_BD) is evaluated, which is on the order of 10⁸ V/m, showing the intrinsic resilience of 2D HOIPs to breakdown and their potential as dielectric materials for 2D electronics. These results delineate the dielectric breakdown process in 2D HOIPs and provide indispensable insights into the electrical failure of 2D HOIPs in devices.

Original language	English (US)
Pages (from-to)	1258-1265
Number of pages	8
Journal	ACS Energy Letters
Volume	10
DOIs	https://doi.org/10.1021/acsenergylett.4c03269
State	Published - 2025

Funding

The research was primarily supported by the donors of the ACS Petroleum Research Fund under Doctoral New Investigator Grant 62603-DNI10 (M.J.) and partially supported by the National Science Foundation under the Award No. CMMI-2311573 and the Texas A&M University System National Laboratory Office Seed Grant (Q.T.). At Northwestern, this work was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under Award DE-SC0024422 (synthesis and fundamental studies of metal halides). I.S. acknowledges support from USF start-up funds. The authors want to thank Mr. Mohammed Shyikh and Ms. Kyeong Yeon Lee for some initial trials in the breakdown experiments and Dr. Leepsa Mishra for her help in some of the literature search.

ASJC Scopus subject areas

Chemistry (miscellaneous)
Renewable Energy, Sustainability and the Environment
Fuel Technology
Energy Engineering and Power Technology
Materials Chemistry

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title = "Dielectric Breakdown of 2D Hybrid Organic-Inorganic Perovskites",

abstract = "Our knowledge about dielectric breakdown of 2D hybrid organic-inorganic perovskites (HOIPs) is limited, although the breakdown is widely observed and harnessed for new device applications. Here, we investigate the out-of-plane breakdown of a benchmark 2D HOIP family, (BA)2MAn-1PbnI3n+1 (BA = butylammonium, MA = methylammonium, and n = 1-5), by conductive atomic force microscopy. Unlike conventional 2D materials, 2D HOIPs manifest milder breakdown morphologies, no clear trend of layer-by-layer damages, and stochastic characteristics of defect percolation, likely due to their low in-plane vs out-of-plane anisotropy. The influence of thickness, ramping rate, and n on the breakdown strength (EBD) is evaluated, which is on the order of 108 V/m, showing the intrinsic resilience of 2D HOIPs to breakdown and their potential as dielectric materials for 2D electronics. These results delineate the dielectric breakdown process in 2D HOIPs and provide indispensable insights into the electrical failure of 2D HOIPs in devices.",

author = "Mengru Jin and Vasileiadou, {Eugenia S.} and Ioannis Spanopoulos and Arushi Chaudhry and Kanatzidis, {Mercouri G.} and Qing Tu",

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doi = "10.1021/acsenergylett.4c03269",

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AU - Jin, Mengru

AU - Vasileiadou, Eugenia S.

AU - Spanopoulos, Ioannis

AU - Chaudhry, Arushi

AU - Kanatzidis, Mercouri G.

AU - Tu, Qing

PY - 2025

Y1 - 2025

N2 - Our knowledge about dielectric breakdown of 2D hybrid organic-inorganic perovskites (HOIPs) is limited, although the breakdown is widely observed and harnessed for new device applications. Here, we investigate the out-of-plane breakdown of a benchmark 2D HOIP family, (BA)2MAn-1PbnI3n+1 (BA = butylammonium, MA = methylammonium, and n = 1-5), by conductive atomic force microscopy. Unlike conventional 2D materials, 2D HOIPs manifest milder breakdown morphologies, no clear trend of layer-by-layer damages, and stochastic characteristics of defect percolation, likely due to their low in-plane vs out-of-plane anisotropy. The influence of thickness, ramping rate, and n on the breakdown strength (EBD) is evaluated, which is on the order of 108 V/m, showing the intrinsic resilience of 2D HOIPs to breakdown and their potential as dielectric materials for 2D electronics. These results delineate the dielectric breakdown process in 2D HOIPs and provide indispensable insights into the electrical failure of 2D HOIPs in devices.

AB - Our knowledge about dielectric breakdown of 2D hybrid organic-inorganic perovskites (HOIPs) is limited, although the breakdown is widely observed and harnessed for new device applications. Here, we investigate the out-of-plane breakdown of a benchmark 2D HOIP family, (BA)2MAn-1PbnI3n+1 (BA = butylammonium, MA = methylammonium, and n = 1-5), by conductive atomic force microscopy. Unlike conventional 2D materials, 2D HOIPs manifest milder breakdown morphologies, no clear trend of layer-by-layer damages, and stochastic characteristics of defect percolation, likely due to their low in-plane vs out-of-plane anisotropy. The influence of thickness, ramping rate, and n on the breakdown strength (EBD) is evaluated, which is on the order of 108 V/m, showing the intrinsic resilience of 2D HOIPs to breakdown and their potential as dielectric materials for 2D electronics. These results delineate the dielectric breakdown process in 2D HOIPs and provide indispensable insights into the electrical failure of 2D HOIPs in devices.

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Dielectric Breakdown of 2D Hybrid Organic-Inorganic Perovskites

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