Differential phase contrast with a segmented detector in a scanning X-ray microprobe

B. Hornberger*, M. D. De Jonge, M. Feser, P. Holl, C. Holzner, C. Jacobsen, D. Legnini, D. Paterson, P. Rehak, L. Strüder, S. Vogt

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

57 Scopus citations


Scanning X-ray microprobes are unique tools for the nanoscale investigation of specimens from the life, environmental, materials and other fields of sciences. Typically they utilize absorption and fluorescence as contrast mechanisms. Phase contrast is a complementary technique that can provide strong contrast with reduced radiation dose for weakly absorbing structures in the multi-keV range. In this paper the development of a segmented charge-integrating silicon detector which provides simultaneous absorption and differential phase contrast is reported. The detector can be used together with a fluorescence detector for the simultaneous acquisition of transmission and fluorescence data. It can be used over a wide range of photon energies, photon rates and exposure times at third-generation synchrotron radiation sources, and is currently operating at two beamlines at the Advanced Photon Source. Images obtained at around 2 keV and 10 keV demonstrate the superiority of phase contrast over absorption for specimens composed of light elements.

Original languageEnglish (US)
Pages (from-to)355-362
Number of pages8
JournalJournal of Synchrotron Radiation
Issue number4
StatePublished - 2008


  • Configured detector
  • Differential phase contrast
  • Fluorescence microprobe
  • Phase contrast
  • Scanning microprobe
  • Segmented detector
  • X-ray microprobe

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation
  • Radiation


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