Diffraction of evanescent waves and nanomechanical displacement detection

Devrez M. Karabacak, Kamil L. Ekinci, Choon How Gan, Gregory J. Gbur, M. Selim Ünlü, Stephen B. Ippolito, Bennett B. Goldberg, P. Scott Carney*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

Sensitive displacement detection has emerged as a significant technological challenge in mechanical resonators with nanometer-scale dimensions. A novel nanomechanical displacement detection scheme based upon the scattering of focused evanescent fields is proposed. The sensitivity of the proposed approach is studied using diffraction theory of evanescent waves. Diffraction theory results are compared with numerical simulations.

Original languageEnglish (US)
Pages (from-to)1881-1883
Number of pages3
JournalOptics Letters
Volume32
Issue number13
DOIs
StatePublished - Jul 1 2007

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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