Direct determination of a radiation damage profile with atomic resolution in ion-irradiated platinum

Dipankar Pramanik*, David N. Seidman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

The field-ion microscope technique has been employed to determine directly a radiation damage profile, with atomic resolution, in a platinum specimen which had been irradiated at 60 K with 20-keV Kr+ ions to a fluence of 5×1012 cm-2. It is shown that the microscopic spatial vacancy distribution (radiation damage profile) is directly related to the elastically deposited energy profile. The experimentally constructed radiation damage profile is compared with a theoretical damage profile - calculated employing the transport of ions in matter (TRIM) Monte Carlo code - and excellent agreement is obtained between the two. Thus, it is demonstrated that it is possible to go directly from a microscopic spatial distribution of vacancies to a continuous radiation damage profile.

Original languageEnglish (US)
Pages (from-to)639-641
Number of pages3
JournalApplied Physics Letters
Volume43
Issue number7
DOIs
StatePublished - 1983

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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