Abstract
Transmission Lorentz microscopy was used to observe the effect of an applied field on the domain structure and magnetization process of NiFe/alumina/Co junctions. The alumina layer was prepared either by oxidizing a sputtered Al layer in air, or by direct sputtering of Al2O3. Two distinct magnetization reversal processes, where NiFe reverses first, followed by the magnetization reversal of Co, were observed with increasing applied field. The range of field values over which the magnetization of NiFe and Co are in an antiparallel configuration is approximately the same for both films. The alumina thickness, and waviness of the interfaces, can affect the magnetization process of the junctions.
Original language | English (US) |
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Pages (from-to) | 503-505 |
Number of pages | 3 |
Journal | Journal of Magnetism and Magnetic Materials |
Volume | 198 |
DOIs | |
State | Published - Jun 1 1999 |
Event | Proceedings of the 1998 3rd International Symposium on Metallic Multilayers (MML-98) - Vancouver, BC, Can Duration: Jun 14 1998 → Jun 19 1998 |
Funding
CCY would like to thank the Croucher Foundation Hong Kong for a scholarship, St Cross College, Oxford and the University of Oxford for a travel grant. AKPL is grateful to the Royal Society for support.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics