Direct observation of domains and magnetization switching processes in NiFe/alumina/Co trilayer junctions

C. C. Yu*, A. K. Petford-Long, J. P. Jakubovics

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

Transmission Lorentz microscopy was used to observe the effect of an applied field on the domain structure and magnetization process of NiFe/alumina/Co junctions. The alumina layer was prepared either by oxidizing a sputtered Al layer in air, or by direct sputtering of Al2O3. Two distinct magnetization reversal processes, where NiFe reverses first, followed by the magnetization reversal of Co, were observed with increasing applied field. The range of field values over which the magnetization of NiFe and Co are in an antiparallel configuration is approximately the same for both films. The alumina thickness, and waviness of the interfaces, can affect the magnetization process of the junctions.

Original languageEnglish (US)
Pages (from-to)503-505
Number of pages3
JournalJournal of Magnetism and Magnetic Materials
Volume198
DOIs
StatePublished - Jun 1 1999
EventProceedings of the 1998 3rd International Symposium on Metallic Multilayers (MML-98) - Vancouver, BC, Can
Duration: Jun 14 1998Jun 19 1998

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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