Direct optical band gap measurement in polycrystalline semiconductors: A critical look at the Tauc method

Alex Dolgonos, Thomas O. Mason, Kenneth R. Poeppelmeier*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

297 Scopus citations

Fingerprint

Dive into the research topics of 'Direct optical band gap measurement in polycrystalline semiconductors: A critical look at the Tauc method'. Together they form a unique fingerprint.

Keyphrases

Engineering