Dislocation-source shutdown and the plastic behavior of single-crystal micropillars

H. Tang*, K. W. Schwarz, H. D. Espinosa

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

112 Scopus citations

Abstract

Dislocation dynamics simulations have been used to study the stress-strain response of single-crystal micropillars containing initial dislocation networks generated via a relaxation procedure intended to approximate real thermal annealing processes. We find that, when such networks are loaded, they exhibit periods of plastic deformation, caused by the operation of single junction-stabilized spiral sources, followed by intervals of purely elastic straining when the sources shut down. The results provide insight into the mechanisms responsible for the experimentally observed staircase stress-strain behavior.

Original languageEnglish (US)
Article number185503
JournalPhysical review letters
Volume100
Issue number18
DOIs
StatePublished - May 6 2008

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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