Dislocation strain as the mechanism of phonon scattering at grain boundaries

Hyun Sik Kim, Stephen D. Kang, Yinglu Tang, Riley Hanus, G. Jeffrey Snyder*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

100 Scopus citations


Thermal conductivities of polycrystalline thermoelectric materials are satisfactorily calculated by replacing the commonly used Casimir model (freqeuncy-independent) with grain boundary dislocation strain model (frequency-dependent) of Klemens. It is demonstrated that the grain boundaries are better described as a collection of dislocations rather than perfectly scattering interfaces.

Original languageEnglish (US)
Pages (from-to)234-240
Number of pages7
JournalMaterials Horizons
Issue number3
StatePublished - May 2016

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Process Chemistry and Technology
  • Electrical and Electronic Engineering


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