Abstract
The imaging equations for high resolution electron microscopy are analysed using an approach based upon expanding the electron wave as positionally modulated diffraction beams. A high-order semi-linear approximation is derived which includes the leading non-linear effects of a reciprocal space integration and can be conveniently expressed in real space. This allows a direct visualisation of imaging effects in real space using a conventional wave dispersion approach. Based on this, the primary sources of lattice fringe artifacts and errors in the 2 1 2D technique are briefly discussed, and an experimental technique for guarding against them employing dark field imaging is described.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 237-242 |
| Number of pages | 6 |
| Journal | Ultramicroscopy |
| Volume | 12 |
| Issue number | 3 |
| DOIs | |
| State | Published - 1983 |
Funding
linear equations, and would also like to thank Dr. A. Howie for his valuable comments and the SERC, UK, for financial support.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation