Dopant distributions in PbTe-based thermoelectric materials

Ivan D. Blum*, Dieter Isheim, David N. Seidman, Jiaqing He, John Androulakis, Kanishka Biswas, Vinayak P. Dravid, Mercouri G. Kanatzidis

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

25 Scopus citations


Atom-probe tomography (APT) is utilized to characterize the dopant distribution in two thermoelectric materials systems: (1) PbTe-2 mol.%SrTe-1 mol.%Na 2Te, and (2) codoped PbTe-1.25 mol.%K-1.4 mol.%Na. We observe the presence of Na-rich precipitates of a few nanometers in diameter in both systems. Both concentration frequency distribution analyses and partial radial distribution functions are employed to analyze the tendency for dopant clustering detected by APT. In the codoped sample, K accumulates significantly in Na-rich precipitates, while in the Sr-containing sample, Sr is homogeneously distributed. High-resolution transmission electron microscopy also reveals the presence of precipitates having platelet morphology, which are oriented parallel to the {001} planes.

Original languageEnglish (US)
Pages (from-to)1583-1588
Number of pages6
JournalJournal of Electronic Materials
Issue number6
StatePublished - Jun 2012


  • K
  • Na
  • PbTe
  • atom-probe tomography
  • precipitates

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry


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