Dopant Mapping of Partially Hydrogenated Vanadium Dioxide using the Energy Loss Near Edge Structure Technique

A. Pofelski, S. Deng, H. Yu, T. J. Park, H. Jia, S. Manna, M. K.Y. Chan, S. K.Rs Sankaranarayanan, S. Ramanathan, Y. Zhu

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1667-1668
Number of pages2
JournalMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Issue number1
StatePublished - Jul 22 2023

ASJC Scopus subject areas

  • Instrumentation

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