Dual-phase Interferometric Confocal Imaging for Electrical Signal Modulation Mapping in ICs

A. Yurt*, E. Ramsay, F. H. Köklü, C. R. Stockbridge, Y. Lu, M. S. Ünlü, B. B. Goldberg

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations
Original languageEnglish (US)
Title of host publicationISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis
PublisherASM International
Pages172-175
Number of pages4
ISBN (Print)9781615039791
StatePublished - Jan 1 2012
Event38th International Symposium for Testing and Failure Analysis, ISTFA 2012 - Phoenix, AZ, United States
Duration: Nov 11 2012Nov 15 2012

Publication series

NameConference Proceedings from the International Symposium for Testing and Failure Analysis

Other

Other38th International Symposium for Testing and Failure Analysis, ISTFA 2012
CountryUnited States
CityPhoenix, AZ
Period11/11/1211/15/12

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

Cite this