Dynamic crystal rotation resolved by high-speed synchrotron X-ray Laue diffraction

J. W. Huang, J. Y. Huang, T. Sun, K. Fezzaa, S. N. Luo*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Dynamic compression experiments are performed on single-crystal Si under split Hopkinson pressure bar loading, together with simultaneous high-speed (250-350?ns resolution) synchrotron X-ray Laue diffraction and phase-contrast imaging. A methodology is presented which determines crystal rotation parameters, i.e. instantaneous rotation axes and angles, from two unindexed Laue diffraction spots. Two-dimensional translation is obtained from dynamic imaging by a single camera. High-speed motion of crystals, including translation and rotation, can be tracked in real time via simultaneous imaging and diffraction.

Original languageEnglish (US)
Pages (from-to)712-717
Number of pages6
JournalJournal of Synchrotron Radiation
Volume23
Issue number3
DOIs
StatePublished - May 1 2016

Keywords

  • crystal rotation
  • synchrotron X-ray Laue diffraction

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation
  • Radiation

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