Dynamic response of the dielectric and electro-optic properties of epitaxial-ferroelectric thin films

B. H. Hoerman*, B. M. Nichols, B. W. Wessels

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

An analysis of the dynamic dielectric and electro-optic relaxation response of thin-film ferroelectrics is presented. The analysis is based upon the relaxation of ferroelectric domains with a continuous distribution of sizes given by percolation theory. The resulting temporal response is described by the expression Φ(t) ∝t-m exp[-(t/τ)β]. The analysis was applied to KNbO3 thin films. Measurements of the polarization, birefringence, and dielectric transients show qualitative agreement with the model over II orders of magnitude in time.

Original languageEnglish (US)
Article number224110
Pages (from-to)2241101-2241105
Number of pages5
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume65
Issue number22
DOIs
StatePublished - Jun 1 2002

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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