TY - JOUR
T1 - Dynamical direct methods for everyone
AU - Sinkler, W.
AU - Marks, L. D.
N1 - Funding Information:
The authors would like to acknowledge helpful discussions with E. Landree and E. Bengu. Collaborations with. K.R. Poeppelmeier, T.O. Mason and J.D. Jorgensen are gratefully acknowledged. We also wish to thank D. Ko and D.D. Edwards for providing samples. The project was made possible through support from the National Science Foundation (DMR 91-20000) through the Science and Technology Center for Superconductivity.
Copyright:
Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.
PY - 1999/1/1
Y1 - 1999/1/1
N2 - Recent work has demonstrated that direct methods, using the minimum relative entropy approach, can be applied to strongly dynamical diffraction from bulk inorganic structures in the present work, the possibility of using intensity data which is thickness averaged, as for a wedge-shaped specimen, is explored. It is shown that for structures which contain a large number of light atoms, well resolved in projection, use of direct methods with thickness averaged data, combined with limited phase information from high- resolution transmission electron microscopy (HRTEM) can indicate the positions of the light atoms. The possibility of using direct methods from thickness-averaged data allows the use of data from conventional microscopes without fine probe capabilities, and is also of importance for use of direct methods with beam-sensitive samples.
AB - Recent work has demonstrated that direct methods, using the minimum relative entropy approach, can be applied to strongly dynamical diffraction from bulk inorganic structures in the present work, the possibility of using intensity data which is thickness averaged, as for a wedge-shaped specimen, is explored. It is shown that for structures which contain a large number of light atoms, well resolved in projection, use of direct methods with thickness averaged data, combined with limited phase information from high- resolution transmission electron microscopy (HRTEM) can indicate the positions of the light atoms. The possibility of using direct methods from thickness-averaged data allows the use of data from conventional microscopes without fine probe capabilities, and is also of importance for use of direct methods with beam-sensitive samples.
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U2 - 10.1016/S0304-3991(98)00062-X
DO - 10.1016/S0304-3991(98)00062-X
M3 - Article
AN - SCOPUS:0032921684
VL - 75
SP - 251
EP - 268
JO - Ultramicroscopy
JF - Ultramicroscopy
SN - 0304-3991
IS - 4
ER -