Abstract
The dynamical diffraction explanation of spot splitting in reflection electron microscopy (REM) and reflection high energy electron diffraction (RHEED) is described within a Bloch wave formalism. The positions of the spots match exactly those measured experimentally and described previously using kinematical theory. Numerically calculated results for misoriented GaAs (001) and Pt(111) surfaces are presented.
Original language | English (US) |
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Pages (from-to) | 183-191 |
Number of pages | 9 |
Journal | Ultramicroscopy |
Volume | 29 |
Issue number | 1-4 |
DOIs | |
State | Published - May 2 1989 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation