Edge effects in buckled thin films on elastomeric substrates

C. T. Koh, Z. J. Liu, D. Y. Khang, J. Song, C. Lu, Y. Huang*, J. A. Rogers, C. G. Koh

*Corresponding author for this work

Research output: Contribution to journalArticle

33 Scopus citations

Abstract

Buckled thin films on elastomeric substrates have many applications. Films of this type exhibit periodic, sinusoidal "wavy" relief profiles, except near edges that lie perpendicular to the wavevector associated with waves. In these locations, the amplitudes of the waves steadily decrease until the films become completely flat, in a manner that can be used to advantage in applications. This paper quantitatively describes the mechanics of this phenomenon. The finite element analysis shows that the edge effect results from the traction-free boundary condition. The edge-effect length is proportional to the thin-film thickness, and decreases with the increasing prestrain and substrate modulus.

Original languageEnglish (US)
Article number133113
JournalApplied Physics Letters
Volume91
Issue number13
DOIs
StatePublished - Oct 5 2007

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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    Koh, C. T., Liu, Z. J., Khang, D. Y., Song, J., Lu, C., Huang, Y., Rogers, J. A., & Koh, C. G. (2007). Edge effects in buckled thin films on elastomeric substrates. Applied Physics Letters, 91(13), [133113]. https://doi.org/10.1063/1.2791004