TY - JOUR
T1 - Effect of UV/ozone treatment on polystyrene dielectric and its application on organic field-effect transistors
AU - Huang, Wei
AU - Fan, Huidong
AU - Zhuang, Xinming
AU - Yu, Junsheng
N1 - Funding Information:
This research was funded by the National Science Foundation of China (Grant No. 61177032), the Foundation for Innovation Research Groups of the NSFC (Grant No. 61421002), and the Fundamental Research Funds for the Central Universities (Grant No. ZYGX2010Z004).
Publisher Copyright:
© 2014, Huang et al.; licensee Springer.
PY - 2014
Y1 - 2014
N2 - The influence of UV/ozone treatment on the property of polystyrene (PS) dielectric surface was investigated, and pentacene organic field-effect transistors (OFETs) based on the treated dielectric was fabricated. The dielectric and pentacene active layers were characterized by atomic force microscopy, X-ray photoelectron spectroscopy, and scanning electron microscopy. The results showed that, at short UVO exposure time (<10 s), the chemical composition of PS dielectric surface remained the same. While at long UVO exposure time (>60 s), new chemical groups, including alcohol/ether, carbonyl, and carboxyl/ester groups, were formed. By adjusting the UVO exposure time to 5 s, the hole mobility of the OFETs increased to 0.52 cm2/Vs, and the threshold voltage was positively shifted to -12 V. While the time of UVO treatment exceeded 30 s, the mobility started to shrink, and the off-current was enlarged. These results indicate that, as a simple surface treatment method, UVO treatment could quantitatively modulate the property of PS dielectric surface by controlling the exposure time, and thus, pioneered a new way to modulate the characteristics of organic electronic devices.
AB - The influence of UV/ozone treatment on the property of polystyrene (PS) dielectric surface was investigated, and pentacene organic field-effect transistors (OFETs) based on the treated dielectric was fabricated. The dielectric and pentacene active layers were characterized by atomic force microscopy, X-ray photoelectron spectroscopy, and scanning electron microscopy. The results showed that, at short UVO exposure time (<10 s), the chemical composition of PS dielectric surface remained the same. While at long UVO exposure time (>60 s), new chemical groups, including alcohol/ether, carbonyl, and carboxyl/ester groups, were formed. By adjusting the UVO exposure time to 5 s, the hole mobility of the OFETs increased to 0.52 cm2/Vs, and the threshold voltage was positively shifted to -12 V. While the time of UVO treatment exceeded 30 s, the mobility started to shrink, and the off-current was enlarged. These results indicate that, as a simple surface treatment method, UVO treatment could quantitatively modulate the property of PS dielectric surface by controlling the exposure time, and thus, pioneered a new way to modulate the characteristics of organic electronic devices.
KW - Organic field-effect transistor (OFET)
KW - Polystyrene dielectric
KW - UV/ozone treatment
KW - X-ray photoelectron spectroscopy
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U2 - 10.1186/1556-276X-9-479
DO - 10.1186/1556-276X-9-479
M3 - Article
C2 - 25258603
AN - SCOPUS:84919951217
SN - 1931-7573
VL - 9
JO - Nanoscale Research Letters
JF - Nanoscale Research Letters
IS - 1
M1 - 479
ER -