Effects of cantilever buckling on vector piezoresponse force microscopy imaging of ferroelectric domains in BiFeO3 nanostructures

Ramesh Nath; Seungbum Hong; Jeffrey A. Klug; Alexandra Imre; Michael J. Bedzyk; Ram S. Katiyar; Orlando Auciello

doi:10.1063/1.3327831

Effects of cantilever buckling on vector piezoresponse force microscopy imaging of ferroelectric domains in BiFeO₃ nanostructures

Ramesh Nath^*, Seungbum Hong, Jeffrey A. Klug, Alexandra Imre, Michael J. Bedzyk, Ram S. Katiyar, Orlando Auciello

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

49 Scopus citations

Abstract

Systematic studies are presented on the effects of cantilever buckling in vector piezoresponse force microscopy (V-PFM) imaging of polarization domains in thin-film based (001)-oriented BiFeO₃ nanostructures, as observed through the coupling of out-of-plane and in-plane PFM images. This effect is a strong function of the laser spot position on the cantilever, being strongest at the free end, and insignificant at 60% of the cantilever length from the pivot point. This finding provides a unique approach to V-PFM imaging of ferroelectric polarization domains, yielding three dimensional PFM images without sample rotation in the plane.

Original language	English (US)
Article number	163101
Journal	Applied Physics Letters
Volume	96
Issue number	16
DOIs	https://doi.org/10.1063/1.3327831
State	Published - Apr 19 2010

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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@article{3e4bc8458b3d4b5490907ebdb259518f,

title = "Effects of cantilever buckling on vector piezoresponse force microscopy imaging of ferroelectric domains in BiFeO3 nanostructures",

abstract = "Systematic studies are presented on the effects of cantilever buckling in vector piezoresponse force microscopy (V-PFM) imaging of polarization domains in thin-film based (001)-oriented BiFeO3 nanostructures, as observed through the coupling of out-of-plane and in-plane PFM images. This effect is a strong function of the laser spot position on the cantilever, being strongest at the free end, and insignificant at 60% of the cantilever length from the pivot point. This finding provides a unique approach to V-PFM imaging of ferroelectric polarization domains, yielding three dimensional PFM images without sample rotation in the plane.",

author = "Ramesh Nath and Seungbum Hong and Klug, {Jeffrey A.} and Alexandra Imre and Bedzyk, {Michael J.} and Katiyar, {Ram S.} and Orlando Auciello",

note = "Funding Information: The experiments were performed at Materials Science Division and Center for Nanoscale Materials at Argonne National Laboratory, a U.S. Department of Energy laboratory, operated under Contract No. DE-AC02–06CH11357. R. Nath acknowledges the support from the Institute of Functional Nanomaterials, University of Puerto Rico under the grant NSF-RII 07-01-525. M. Bedzyk acknowledges NU-MRSEC support under NSF-DMR-0520513.",

year = "2010",

month = apr,

day = "19",

doi = "10.1063/1.3327831",

language = "English (US)",

volume = "96",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

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T1 - Effects of cantilever buckling on vector piezoresponse force microscopy imaging of ferroelectric domains in BiFeO3 nanostructures

AU - Nath, Ramesh

AU - Hong, Seungbum

AU - Klug, Jeffrey A.

AU - Imre, Alexandra

AU - Bedzyk, Michael J.

AU - Katiyar, Ram S.

AU - Auciello, Orlando

N1 - Funding Information: The experiments were performed at Materials Science Division and Center for Nanoscale Materials at Argonne National Laboratory, a U.S. Department of Energy laboratory, operated under Contract No. DE-AC02–06CH11357. R. Nath acknowledges the support from the Institute of Functional Nanomaterials, University of Puerto Rico under the grant NSF-RII 07-01-525. M. Bedzyk acknowledges NU-MRSEC support under NSF-DMR-0520513.

PY - 2010/4/19

Y1 - 2010/4/19

N2 - Systematic studies are presented on the effects of cantilever buckling in vector piezoresponse force microscopy (V-PFM) imaging of polarization domains in thin-film based (001)-oriented BiFeO3 nanostructures, as observed through the coupling of out-of-plane and in-plane PFM images. This effect is a strong function of the laser spot position on the cantilever, being strongest at the free end, and insignificant at 60% of the cantilever length from the pivot point. This finding provides a unique approach to V-PFM imaging of ferroelectric polarization domains, yielding three dimensional PFM images without sample rotation in the plane.

AB - Systematic studies are presented on the effects of cantilever buckling in vector piezoresponse force microscopy (V-PFM) imaging of polarization domains in thin-film based (001)-oriented BiFeO3 nanostructures, as observed through the coupling of out-of-plane and in-plane PFM images. This effect is a strong function of the laser spot position on the cantilever, being strongest at the free end, and insignificant at 60% of the cantilever length from the pivot point. This finding provides a unique approach to V-PFM imaging of ferroelectric polarization domains, yielding three dimensional PFM images without sample rotation in the plane.

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ER -

Effects of cantilever buckling on vector piezoresponse force microscopy imaging of ferroelectric domains in BiFeO₃ nanostructures

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