Effects of cantilever buckling on vector piezoresponse force microscopy imaging of ferroelectric domains in BiFeO3 nanostructures

Ramesh Nath*, Seungbum Hong, Jeffrey A. Klug, Alexandra Imre, Michael J. Bedzyk, Ram S. Katiyar, Orlando Auciello

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

39 Scopus citations

Abstract

Systematic studies are presented on the effects of cantilever buckling in vector piezoresponse force microscopy (V-PFM) imaging of polarization domains in thin-film based (001)-oriented BiFeO3 nanostructures, as observed through the coupling of out-of-plane and in-plane PFM images. This effect is a strong function of the laser spot position on the cantilever, being strongest at the free end, and insignificant at 60% of the cantilever length from the pivot point. This finding provides a unique approach to V-PFM imaging of ferroelectric polarization domains, yielding three dimensional PFM images without sample rotation in the plane.

Original languageEnglish (US)
Article number163101
JournalApplied Physics Letters
Volume96
Issue number16
DOIs
StatePublished - Apr 19 2010

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Effects of cantilever buckling on vector piezoresponse force microscopy imaging of ferroelectric domains in BiFeO<sub>3</sub> nanostructures'. Together they form a unique fingerprint.

Cite this