Abstract
Systematic studies are presented on the effects of cantilever buckling in vector piezoresponse force microscopy (V-PFM) imaging of polarization domains in thin-film based (001)-oriented BiFeO3 nanostructures, as observed through the coupling of out-of-plane and in-plane PFM images. This effect is a strong function of the laser spot position on the cantilever, being strongest at the free end, and insignificant at 60% of the cantilever length from the pivot point. This finding provides a unique approach to V-PFM imaging of ferroelectric polarization domains, yielding three dimensional PFM images without sample rotation in the plane.
Original language | English (US) |
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Article number | 163101 |
Journal | Applied Physics Letters |
Volume | 96 |
Issue number | 16 |
DOIs | |
State | Published - Apr 19 2010 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)