Effects of film thickness on the yielding behavior of polycrystalline gold films

Horacio Dante Espinosa*, B. C. Prorok

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

11 Scopus citations

Abstract

A Membrane Deflection Experiment was used to test the mechanical response of freestanding thin film gold specimens. We present stress-strain curves obtained on films 0.3, 0.5 and 1.0 μm thick. Elastic modulus was consistently measured in the range of 53-55 GPa. Several size effects on the mechanical properties were observed including yield stress variations with membrane width and film thickness. It was observed that thickness plays a key role in deformation behavior with a major transition in the material inelastic response occurring between a thickness of 0.5 and 1.0 μm. The size effects here reported are the first of their kind in the sense that the measurements were performed under a macroscopically homogeneous axial deformation, i.e., in the absence of macroscopic deformation gradients.

Original languageEnglish (US)
Pages (from-to)349-354
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume695
StatePublished - Jan 1 2002
EventThin Films: Stresses and Mechanical Properties IX - Boston, MA, United States
Duration: Nov 26 2001Nov 30 2001

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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