Abstract
We have observed excitation of spin echoes and spin free induction decay (FID) by electromagnetically induced transparency (EIT) in an optically dense solid sample. The experiments are done in a double-lambda system of 605.7 nm 3H4 - 1D2 transition of Pr3+:Y2SiO5, where the 10.2 MHz ground state spin coherence is excited by low-power resonant Raman pulses. It has been shown that the spin coherence, including spin echo, is equivalent to the transparent state of EIT, and therefore a high efficiency is expected for such resonant Raman-excited spin echo. The observed efficiency of spin echo is as high as 75% of the FID signal at 5 K. A background-free detection scheme is used based on EIT and enhanced nondegenerate four-wave mixing. The technique is applied in the frequency-selective time-domain optical data storage, that utilizes the spin as well as the optical inhomogeneous spectral widths. The data storage scheme is analogous to the stimulated spin echo with resonant Raman excitation of the spin coherence. We verify that the write window is determined by the spin T2 which is much longer than the optical T2, especially at higher temperature. We find that the spin dephasing time T2 is almost constant at approximately 500 μs in the range of 2 to approximately 6 K, whereas the optical T2 decreases rapidly, by a factor of approximately 50, above 4 K. These results will be useful in the development of high capacity time-domain optical data storage operating at higher temperature.
Original language | English (US) |
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Pages (from-to) | 134-143 |
Number of pages | 10 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 3468 |
State | Published - Dec 1 1998 |
Event | Proceedings of the 1998 Conference on Advanced Optical Memories and Interfaces to Computer Storage - Duration: Jul 22 1998 → Jul 24 1998 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering