Efficient parameter variation sampling for architecture simulations

Feng Lu*, Russell E Joseph, Goce Trajcevski, Song Liu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

This paper addresses the problem of efficient and effective parameter variation modeling and sampling in computer architecture simulations. While there has been substantial progress in accelerating simulation time for circuit designs subject to manufacturing variations, these approaches are not generally suitable for architectural studies. Toward this we investigated two complementary avenues: (1) adapting low-discrepancy sampling methods for use in Monte Carlo architectural simulations. We apply techniques previously developed for gate-level circuit models to higher level component models and in so doing drastically reduce the number of samples needed for detailed simulation; (2) applying multi-resolution analysis to appropriately decompose geometric regions of a chip, and achieve more effective description of parameter variations without increasing computational complexity. Our experimental results demonstrate that the combined techniques can reduce the number of Monte Carlo trials by a factor of 3.3, maintaining the same accuracy while significantly reducing the overall simulation run-time.

Original languageEnglish (US)
Title of host publicationProceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2011
Pages1578-1583
Number of pages6
StatePublished - May 31 2011
Event14th Design, Automation and Test in Europe Conference and Exhibition, DATE 2011 - Grenoble, France
Duration: Mar 14 2011Mar 18 2011

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Other

Other14th Design, Automation and Test in Europe Conference and Exhibition, DATE 2011
CountryFrance
CityGrenoble
Period3/14/113/18/11

ASJC Scopus subject areas

  • Engineering(all)

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